Freescale Semiconductor MC9S12XDP512 Microscope & Magnifier User Manual


 
Appendix A Electrical Characteristics
MC9S12XDP512 Data Sheet, Rev. 2.11
950 Freescale Semiconductor
A.6 MSCAN
A.7 SPI Timing
This section provides electrical parametrics and ratings for the SPI. In Table A-24 the measurement
conditions are listed.
Table A-22. PLL Characteristics
Conditions are shown in Table A-4 unless otherwise noted
Num C Rating Symbol Min Typ Max Unit
1 P Self clock mode frequency f
SCM
1 5.5 MHz
2 D VCO locking range f
VCO
8 80 MHz
3 D Lock detector transition from acquisition to tracking mode |∆
trk
|3 4%
1
1
% deviation from target frequency
4 D Lock detection |∆
Lock
| 0 1.5 %
1
5 D Unlock detection |∆
unl
| 0.5 2.5 %
1
6 D Lock detector transition from tracking to acquisition mode |∆
unt
|6 8%
1
7 C PLLON total stabilization delay (auto mode)
2
2
f
osc
= 4 MHz, f
BUS
= 40 MHz equivalent f
VCO
= 80 MHz: REFDV = #$00, SYNR = #$09, C
S
= 4.7 nF, C
P
= 470 pF, R
S
= 4.7 k
t
stab
0.24 ms
8 D PLLON acquisition mode stabilization delay
2
t
acq
0.09 ms
9 D PLLON tracking mode stabilization delay
2
t
al
0.16 ms
10 D Fitting parameter VCO loop gain K
1
–195 MHz/V
11 D Fitting parameter VCO loop frequency f
1
126 MHz
12 D Charge pump current acquisition mode | i
ch
| 38.5 µA
13 D Charge pump current tracking mode | i
ch
| 3.5 µA
14 C Jitter fit parameter 1
2
j
1
0.9 1.3 %
15 C Jitter fit parameter 2
2
j
2
0.02 0.12 %
Table A-23. MSCAN Wake-up Pulse Characteristics
Conditions are shown in Table A-4 unless otherwise noted
Num C Rating Symbol Min Typ Max Unit
1 P MSCAN wakeup dominant pulse filtered t
WUP
—— 2µs
2 P MSCAN wakeup dominant pulse pass t
WUP
5——µs
Table A-24. Measurement Conditions
Description Value Unit
Drive mode Full drive mode
Load capacitance C
LOAD
1
,
on all outputs
1
Timing specified for equal load on all SPI output pins. Avoid asymmetric load.
50 pF
Thresholds for delay measurement points (20% / 80%) V
DDX
V