Freescale Semiconductor MC9S12XDP512 Microscope & Magnifier User Manual


 
Appendix A Electrical Characteristics
MC9S12XDP512 Data Sheet, Rev. 2.11
Freescale Semiconductor 935
A.2.3 ATD Accuracy
A.2.3.1 5-V Range
Table A-15 specifies the ATD conversion performance excluding any errors due to current injection, input
capacitance, and source resistance.
A.2.3.2 3.3-V Range
Table A-16 specifies the ATD conversion performance excluding any errors due to current injection, input
capacitance, and source resistance.
Table A-15. 5-V ATD Conversion Performance
Conditions are shown in Table A-4 unless otherwise noted
V
REF
= V
RH
–V
RL
= 5.12 V. Resulting to one 8-bit count = 20 mV and one 10-bit count = 5 mV
f
ATDCLK
= 2.0 MHz
Num C Rating Symbol Min Typ Max Unit
1 P 10-bit resolution LSB 5 mV
2 P 10-bit differential nonlinearity DNL –1 1 Counts
3 P 10-bit integral nonlinearity INL –2.5 ±1.5 2.5 Counts
4 P 10-bit absolute error
1
1
These values include the quantization error which is inherently 1/2 count for any A/D converter.
AE –3 ±2.0 3 Counts
5 P 8-bit resolution LSB 20 mV
6 P 8-bit differential nonlinearity DNL –0.5 0.5 Counts
7 P 8-bit integral nonlinearity INL –1.0 ±0.5 1.0 Counts
8 P 8-bit absolute error
1
AE –1.5 ±1.0 1.5 Counts
Table A-16. 3.3-V ATD Conversion Performance
Conditions are shown in Table A-4 unless otherwise noted
V
REF
= V
RH
–V
RL
= 3.328 V. Resulting to one 8-bit count = 13mV and one 10-bit count = 3.25 mV
f
ATDCLK
= 2.0 MHz
Num C
Rating Symbol Min Typ Max Unit
1 P 10-bit resolution LSB 3.25 mV
2 P 10-bit differential nonlinearity DNL –1.5 1.5 Counts
3 P 10-bit integral nonlinearity INL –3.5 ±1.5 3.5 Counts
4 P 10-bit absolute error
1
1
These values include the quantization error which is inherently 1/2 count for any A/D converter.
AE –5 ±2.5 5 Counts
5 P 8-bit resolution LSB 13 mV
6 P 8-bit differential nonlinearity DNL –0.5 0.5 Counts
7 P 8-bit integral nonlinearity INL –1.5 ±1.0 1.5 Counts
8 P 8-bit absolute error
1
AE –2.0 ±1.5 2.0 Counts