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8 Spectrum Emission Mask Measurement
The spectrum emission mask measures spurious signal levels in up to six pairs of offset frequencies and
relates them to the carrier power. For measurement results and views, see “View/Display” on page 566.
This topic contains the following sections:
“Measurement Commands for Spectrum Emission Mask” on page 469
“Remote Command Results for Spectrum Emission Mask Measurement” on page 469
“Number of Offsets” on page 486
Measurement Commands for Spectrum Emission Mask
Offsets that are turned off (inactive) return –999.0 when their results are queried via SCPI.
:CONFigure:SEMask
:CONFigure:SEMask:NDEFault
:INITiate:SEMask
:FETCh:SEMask[n]?
:MEASure:SEMask[n]?
:READ:SEMask[n]?
For more measurement related commands, see the SENSe subsystem, and the section “Remote
Measurement Functions” on page 1031.
Remote Command Results for Spectrum Emission Mask Measurement
The following table describes the results returned by the FETCh, MEASure, and READ queries listed
above, according to the index value n:
Modes n Return Value
All except
WLAN
1 Meas Type: Total Power Reference
Returns 82 comma-separated scalar results, in the following order:
1. Reserved for the future use, returns –999.0
2. Absolute power at the center frequency (reference) area (dBm)
3. Reserved for the future use, returns –999.0
4. Reserved for the future use, returns –999.0
5. Peak frequency in the center frequency (reference) area (Hz)
6. Reserved for the future use, returns –999.0
7. Reserved for the future use, returns –999.0
8. Reserved for the future use, returns –999.0