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About the Test Set
How the Test Set Is Used
NOTE Some measurements which are not marked “available to sequencer” can be
replaced by a basic measurement function which is available in the Sequence
Analyzer mode. For example, it is possible to use the basic Power measurement in
Sequence Analyzer mode as a substitute for a Channel Power measurement from
one of the other modes. Some measurements are not currently supported by the
analyzer list sequencer, and therefore can be run only in the native mode of the
measurement.
TD-SCDMA with
HSPA/8PSK
(U9079A)
• Burst Power (Transmit Power)
• Power vs Time
• ACP (available to sequencer)
• Spectrum Emission Mask (available to sequencer)
• Occupied Bandwidth (available to sequencer)
• Code Domain Power (available to sequencer)
• Conformance Error Vector Magnitude (available to sequencer)
LTE Mode (U9080A) • Channel Power
• Modulation Analysis (available to sequencer)
• Occupied Bandwidth (available to sequencer)
• ACP (available to sequencer)
• Spectrum Emission Mask (available to sequencer)
• Conformance Error Vector Magnitude (available to sequencer)
Bluetooth (U9081A) • ACP
• LE In-band Emissions
• EDR In-band Spurious Emissions
• Occupied Bandwidth
• Transmit Analysis
LTE TDD Mode
(U9082A)
• Channel Power
• Occupied Bandwidth (available to sequencer)
• ACP (available to sequencer)
• Spectrum Emission Mask (available to sequencer)
• Transmit On/Off Power (available to sequencer)
• LTE Modulation Analysis (available to sequencer)
• Conformance Error Vector Magnitude (available to sequencer)
Table 2-1 Applications and Measurements in the Test Set
Application Measurement