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FOREWORD - 1
FOREWORD
APPLICATION
• The S-3400N SEM utilizes an electron beam accelerated at 300V to
30kV. The instrument is designed mainly for observation and
evaluation of specimens prepared for the SEM.
• Note that Hitachi Science Systems, Ltd. will not be responsible for
injury or damage caused by usage of the instrument in a manner not
described in this manual.
CAUTION
The electron microscope need not conform to the “Radiation Hazard
Preventive Laws” or “Ionizing Radiation Hazard Preventive Regulations”
currently in effect throughout the world, unlike the instruments designed to
produce X-rays.
The suggestion made by the ICRP (International Committee on Radiation
Hazard Prevention), however, clearly defines that the electron
microscope, like the home television set, will potentially produce a certain
amount of X-rays as an undesirable byproduct. From a safety viewpoint,
therefore, it is essential to operate the instrument carefully taking into
account the following fundamental precautions.
(1) Use the instrument within the application range specified in the
catalog or instruction manual.
(2) Do not operate the instrument with covers or doors removed, nor use
alternatives for these components.
(3) Do not apply modifications which may possibly result in deactivation
of the built-in safety devices.