Hitachi S-3400N Microscope & Magnifier User Manual


 
2.3 Graphical User Interface (GUI)
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Low: Long life mode (so that the filament can be used for a long time)
Medium: Standard mode
High: High resolution mode (when the filament current is to be set near the
saturation point for the emission current)
AFS can give an error if the filament is improperly installed or an emission current above
a specified level fails to flow when a low accelerating voltage is applied.
(d) Gun Bias
This button, which sets a gun bias, can be used to adjust the emission current.
The Auto Gun Bias function automatically sets an appropriate gun bias when the
accelerating voltage is changed. Normally this button should be check marked.
The correct operation of Auto Gun Bias requires the Auto Beam Setting (ABS) function,
which is enabled when the ABS button is clicked. It is recommended that ABS be
turned on whenever filaments are changed.
(e) Probe Current
This button, which sets a probe current, is functionally equivalent to the ELECTRON
BEAM window on the Operation Panel.
(2) Focusing position (WD) WORKING DISTANCE window
This button, which sets a focusing position (WD), is functionally equivalent to the WORKING
DISTANCE window on the Operation Panel.
(3) Degauss button
The Degauss operation eliminates hysteresis of the magnetic field in the objective lens.
When focus is changed greatly, accuracy of magnification or alignment of the electron
optical axis may degrade due to hysteresis of the focusing magnetic field.
Click Degauss button under the following conditions:
After large change of focus without change of WD or Vacc in their respective windows.
Before making the electron optical axis alignment.
Degaussing is automatically effected when WD is changed in the WORKING DISTANCE
windows, when the accelerating voltage is changed, or when a new Probe Current mode is
selected.
NOTICE: The F2 hotkey also available for degauss operation.