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(min(scapTestDischgToutMs,
scaplnitDischgMs) - 10)))
where
scapCurDischgMs = Most recent
discharge
time (limited by apTestDischgToutMs).
scapTestDischgToutMs = timeout
“ceiling"
(msec), specified via ConfigDrive
Unique
scaplnitDischgMs = Initial discharge
time
for Holdup Circuit characterization at
mfg
time (characterization may be
performed with a higher timeout
“ceiling")
Normalized Value Range:
Best = 100 ("Holdup Circuit Test"
passed)
Worst = 1 (indicates the hold-up
capability
has degraded too far)
Raw Usage:
[1-0]: Latest "Holdup Circuit Test"
discharge time
(in milliseconds).
whose capacitance value is
degraded past the point of
reliability to protect SSD data.
If an SSD has never run a
“Holdup Circuit Test", the
normalized value of this Attribute
remains at '100'. This feature is
not available for industrial
versions, which are VRFS1xGA,
VRFS1xGK and VRFS1xGM
from Host
System
Indicates the number of bytes (in 64GB
resolution) written to the drive by a host
system, over the life of the drive.
Usage:
[6-4] : None (0x00)
[3-0]: Count of 64GB units written
This Attribute returns a byte
count, in units of Gigabytes at an
update resolution of 64
GBytes. The count represents
the number of bytes written. The
Attribute reads ‘0’ until the
number of bytes written reaches
64GB; at 64GB the Attribute
increments to a value of
Host System
Indicates the number of bytes (in 64GB
resolution) read from the drive by a
host system, over the life of the drive.
Usage:
[6-4] : None (0x00)
[3-0]: Count of 64GB units read
This Attribute returns a byte
count, in units of Gigabytes at an
update resolution of 64 GB.
The count represents the
number of bytes read. The
Attribute reads ‘0’ until the
number of bytes read reaches
64GB; at 64GB the count
increments to a value of ‘64’
