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5.1.9.2 Supported Baseline Attribute Details
The table below provides a detailed description of supported S.M.A.R.T.
attributes and how they may be used.
Table 5-6: Baseline S.M.A.R.T. Attribute Details
Rate
Raw error rate related to ECC errors.
Errors are counted as ECC errors
above a threshold. For the
CONTROLLER, this attribute
includes Uncorrectable ECC (UECC)
errors, and Uncorrectable RAISE
(URAISE)errors.
Normalized Equation:
10log10(BitsRead/ReadErrors + 1)
SectorsRead= Number of sectors read
SectorsToBits= 512*8
BitsRead= SectorsRead*SectorsToBits
Normalized Value Range:
Best = 100
Worst = 1
Invalid = 0
Raw Usage
includes two types of ECC errors
that are tracked by the
CONTROLLER: UECC and
URAISE. The normalized
equation for Raw read error rate
is logarithmic since the valid
BER range of the attribute spans
from 1.00E-10 to 1.00E-12. To
force positive numbers, the
numerator and denominator
are flipped. One is then added to
the number of errors in the
denominator to avoid a
divide-by-0 condition if no errors
are encountered. By taking the
log of the inverted BER and
multiplying by ten a reasonable
range of normalized values from
120 to 38 (representing a BER
range of 1.00E-13 to 1.68E-04 )
are presented.
This Attribute reads ‘0’ until a
sample size between 10E10 and
10E12 is available to be
tracked by this Attribute.
:
[3-0] : Number of sectors read
[6-4]: Read errors (UECC+URAISE)
