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Indicates the approximate SSD life left,
in terms of PE cycles and Flash blocks
currently available for use.
Normalized Equation:
SSD Life Left = MIN[ MAX(termA, 10),
termB]
termA = (Unused)/(Rated) x 100
Unused = (unused PE cycles)
Rated = (rated PE cycles)
termB = (AvailExcess)/(OrigExcess)
AvailX = (Blocks above min req’d)
OrigX = (Original blks above min
req’d)
Normalized Value Range:
100 = Best = Full SSD life remains
10 = Replace = Sufficient Flash blocks
still in service, but rated PE Cycles
consumed
1 = Worst = Insufficient Flash blocks
remain in service; EOL; drive is read-
SSD life left is based on actual
usage and takes into account PE
cycle consumption and Flash
block retirement.
PE cycle usage at a rate less
than the rate used for
performance throttling will result
in extending drive life. Actual
Flash endurance remaining is
normally greater than the
unused rated PE cycles.
Note that block retirement rate
also affects SSD life and this
Attribute value.
Reserved Space
Indicates the amount of Flash memory
space in reserve. This is the Reserve
Block Count (Attribute 170)
represented in Gigabytes.
Usage:
[3-0]: [(RB) x (PPB) x (BPP)] / (1024^3)
[6-4] : None (0x00)
RB = Reserve Blocks (see Attribute
170)
PPB = Pages per Block
BPP = Bytes per Page
This Attribute returns a count of
GB equal to the number of Flash
Blocks in service over and
above the minimum block count
required. This Attribute is
Attribute 170 presented in
units of GB.
The Attribute value is returned in
units of Gigabytes at an update
resolution of 64 GBytes. The
value is initially the number of
GB equal to the total Reserve
Block Count. As the value is
updated (decremented), it
decrements in 64GB resolution.
For example, if the initial value is
n, the next update will decrement
Backup Health
Indicates the condition of an external
holdup circuit
based on test results from the flash
controller "Holdup Circuit Test".
Normalized Equation:
estimation of capacitive hold-up
capability based on a timed
min(100, (100* (scapCurDischgMs -
discharge test, wherein
discharge (past a predefined
voltage threshold) faster than a
predefined time-value threshold
indicates a capacitor bank
