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Attribute Sector
The S.M.A.R.T. Attribute Sector defines attribute format and the data structure is
defined in the following table.
Table 5-7: S.M.A.R.T. Attribute Data Structure
0:1 S.M.A.R.T. structure version number
2 First Stored Attribute Number (i.e. “1” for RawErrorRate)
3:4 Status
5 Nominal value
6 Worst value since SSD was deployed
7:12 Raw Data
13 Reserved
14:25 Next Stored Attribute Number (ie “3” for “Retired Block Count”)
26:361
Next Stored Attribute Numbers (max 30 collected Attributes, including
above)
362 Off-line data collection status
363 Self-test execution status byte
364:365 Total time to complete off-line data collection (in seconds)
366 Reserved
367 Off-line Data Collection capability
368:369 S.M.A.R.T. capability
370 Error Logging Capability (bit 0 set = device error logging supported)
371 Next Self Test Step
372 Short Self Test routine recommended polling time (in minutes)
373 Extended Self Test routine recommended polling time (in minutes)
374 Recommended polling time for Conveyance Self Test
375:376 Time for Extended Self Test if > 255 (ie, 373 to FFh)
377:385 Reserved
386:510 Vendor Information
511 Checksum of data structure (generated on retrieval of stored data)
Notes: Bytes 2:361 are vendor unique
5.1.4 Threshold Sector
The S.M.A.R.T. Threshold Sector defines attribute trip thresholds. Attributes are
compared to the thresholds when the S.M.A.R.T. Return Status Command (DA)
retrieves drive reliability Status. The S.M.A.R.T. Read Threshold Sector
Command (DI) then used to read this information. Threshold information may be
modified or written via the S.M.A.R.T. Write Threshold Value Command (D7).
Threshold values are obtained from the Saved Configuration Page.
