Nikon LV150 Microscope & Magnifier User Manual


 
8 9
Improved performance
Usability has been vastly improved as has durability and rigidity.
Improved performance
Highly rigid, vibration-free body
The use of structural analysis during the design process
has improved rigidity and antivibration parameters to
yield clear images even at high magnification.
Tilting trinocular eyepiece tube
LV-TT2 Tilting Trinocular Eyepiece
Tube
The newly developed LV-TT2 tilting trinocular
eyepiece tube (erect image) offers comfort to all
users, regardless of their stature or viewing
position. The optical path changeover of
100:0/20:80 allows the simultaneous use of a
monitor.
Highly durable motorized nosepiece
LV-NU5A Nosepiece
The LV-NU5A motorized universal quintuple
nosepiece is 10 times more durable than its
predecessor and can be used with the LV150A. In
combination with the LV-NCNT motorized
nosepiece controller, it can also be used in other
devices.
Manual nosepiece
A variety of manual nosepieces are available to suit
all needs.
Thorough ESD protection
All parts of the microscope that might be touched,
including the body, tube and stage, have been
insulated. This improves anticontamination and
prevents samples from being harmed by static
electricity, thereby improving yields.
Electrostatic decay time: 1000-10V, within 0.2 sec.
C-N6 Nosepiece
(Brightfield)
L-NBD5 Nosepiece
(Bright/darkfield)
L-NU5 Nosepiece
(Universal)
LV-P
Plate
Brightfield
The antiflare design applied
to the objective lenses and
light source ensures bright,
high-contrast images.
Darkfield
Nikon’s unique “Fly-eye
Lens” used in the darkfield
illuminator yields a
threefold increase in
brightness over previous
models. This allows high-
sensitivity detection of
defects and height gaps in
samples.
Nomarski DIC
Standard or high contrast DIC
sliders can be selected to suit
the sample. This method is
useful for the surface
observations of various
devices and precision molds.
Epi-fluorescence
UV, V, BV, B or G excitation
fluorescence filter blocks can
be selected. This method is
perfect for the observation of
OEL, ion migration and other
substrate uses.
L-DIC DIC Prism (standard) L-DIHC DIC Prism (high contrast) Brightfield Epi-fluorescence B-2A
Fluorescence filter blocks
Simple polarizing
In addition to simple
polarizing, a lambda plate
can be inserted into the
optical path to achieve
observations with a first-
order compensator. This is
useful for liquid crystal
inspections (when used in
combination with the LV-
UEPI 2).
Double-beam interferometry equipment
(measures minute height gaps)
Michelson (TI) and Mirau (DI)
types of episcopic double-
beam interferometry can be
carried out. A filar micrometer
eyepiece can be used to
examine or measure samples
while avoiding direct contact.
Diascopic illumination
Diascopic illumination is
used to observe optical
parts, FPD and other samples
that transmit light.
Episcopic Two-beam Interferometry Equipment TI/DI
Condenser
Observation Methods
YM-PO
Polarizer
LV-UV
Polarizer
LV-FLAN FL
Analyzer
L-AN
Analyzer
LV-PO
Polarizer
LV-FLAN
FL Analyzer
L-DIC
DIC Prism
L-DICH[??]
High-contrast
DIC Prism
YM-PO
Polarizer
L-AN
Analyzer